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Volumn 30, Issue 1-2, 1998, Pages 31-45

Process capability study and thermal fatigue life prediction of ceramic BGA solder joints

Author keywords

BGA; Fatigue life prediction; FEM; Process capability; Solder joints

Indexed keywords

CERAMIC MATERIALS; FATIGUE OF MATERIALS; FINITE ELEMENT METHOD; PROCESS ENGINEERING; SERVICE LIFE; THERMAL EFFECTS;

EID: 0032118032     PISSN: 0168874X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-874X(98)00032-8     Document Type: Article
Times cited : (13)

References (9)
  • 1
  • 2
    • 0028087381 scopus 로고
    • A high-density C4/CBGA interconnection technology for a CMOS microprocessor
    • Washington, DC, USA
    • G. Kromann, D. Gerke, W. Huang, A high-density C4/CBGA interconnection technology for a CMOS microprocessor, 44th Electronic Components and Technology Conf., Washington, DC, USA, 1994, pp. 22-28.
    • (1994) 44th Electronic Components and Technology Conf. , pp. 22-28
    • Kromann, G.1    Gerke, D.2    Huang, W.3
  • 3
    • 0003632150 scopus 로고    scopus 로고
    • Ceramic/Tape/Micro BGA Consortium, Gintic Institute of Manufacturing Technology, Singapore
    • Z.P. Wang, C.K. Meng, S.V. Divan, T.Y. Meng, D.J. Xie, Final Report, Ceramic/Tape/Micro BGA Consortium, Gintic Institute of Manufacturing Technology, Singapore, 1996.
    • (1996) Final Report
    • Wang, Z.P.1    Meng, C.K.2    Divan, S.V.3    Meng, T.Y.4    Xie, D.J.5
  • 4
    • 0345961251 scopus 로고    scopus 로고
    • Reliability results for a wire bondable tape ball grid array package
    • R.D. Schueller, Reliability results for a wire bondable tape ball grid array package, Proc. Surface Mount Int., 1996, pp. 12-17.
    • (1996) Proc. Surface Mount Int. , pp. 12-17
    • Schueller, R.D.1
  • 8
    • 0003309562 scopus 로고
    • Integrated Matrix Creep: Application to Accelerated Testing and Lifetime Prediction
    • J.H. Lau (Ed.), Van Nostrand Reinhold, New York
    • S. Knecht, L. Fox, Integrated Matrix Creep: Application to Accelerated Testing and Lifetime Prediction, in: J.H. Lau (Ed.), Solder Joint Reliability: Theory and Applications, Van Nostrand Reinhold, New York, 1991, pp. 508-544.
    • (1991) Solder Joint Reliability: Theory and Applications , pp. 508-544
    • Knecht, S.1    Fox, L.2
  • 9
    • 0000906698 scopus 로고
    • Life prediction and accelerated testing
    • D.R. Fear, S.N. Burchett, H.S. Morgan, J.H. Lau (Eds.), Van Norstrand Reinhold, New York
    • H.D. Solomon, Life prediction and accelerated testing, in: D.R. Fear, S.N. Burchett, H.S. Morgan, J.H. Lau (Eds.), The Mechanics of Solder Alloy Interconnects, Van Norstrand Reinhold, New York, 1994, pp. 199-313.
    • (1994) The Mechanics of Solder Alloy Interconnects , pp. 199-313
    • Solomon, H.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.