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Thin Solid Films

Volumn 325, Issue 1-2, 1998, Pages 223-231

D-thin films of ferrocene derivatives: Optical gas sensing and structural studies

(5) Sykesud, C G D a Zhdan, P A b Walton, D J a Miller, L S a Jasper, C A c

a Faculty of Engineering and Computing (United Kingdom)

b UNIVERSITY OF SURREY (United Kingdom)

c Gas Research Centre (United Kingdom)

Author keywords

Atomic force microscopy (AFM); Ferrocene; Gas sensor; Langmuir Blodgett films; Nitrogen dioxide; Reflectometry; X ray photoelectron spectroscopy (XPS)

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL SENSORS; IRON COMPOUNDS; LANGMUIR BLODGETT FILMS; LIGHT EMITTING DIODES; NITROGEN OXIDES; ORGANOMETALLICS; PHOTODIODES; VACUUM DEPOSITED COATINGS; X RAY PHOTOELECTRON SPECTROSCOPY;

FERROCENE; INTERFERENCE ENHANCED REFLECTOMETRY TECHNIQUE;

ANTIREFLECTION COATINGS;

EID: 0032117410 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(98)00502-1 Document Type: Article

Times cited : (3)

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