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Volumn 106, Issue 1, 1998, Pages 82-89
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Studies of the evolution of the topography of selected materials as a function of etching in reactive and non-reactive r.f. plasmas
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Author keywords
[No Author keywords available]
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Indexed keywords
ARGON;
ATOMIC FORCE MICROSCOPY;
CRYSTAL LATTICES;
GRAPHITE;
MICA;
MOLYBDENUM COMPOUNDS;
OXYGEN;
PRESSURE EFFECTS;
SCANNING TUNNELING MICROSCOPY;
SURFACE ROUGHNESS;
TOPOGRAPHY;
PLASMA ETCHING;
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EID: 0032117271
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/S0257-8972(97)90142-0 Document Type: Article |
Times cited : (2)
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References (4)
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