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Volumn 303, Issue 3-4, 1998, Pages 231-245

Interface fabrication of YBa2Cu3Oy ramp-edge junction with PrBa2(Cu1-xCox)3Oy barrier layer in enhanced oxidizing atmosphere

Author keywords

Electron cyclotron resonance; Ramp edge junction; YBa2Cu3Oy

Indexed keywords

ANNEALING; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; ELECTRON CYCLOTRON RESONANCE; ETCHING; FILM GROWTH; MAGNETIC FIELD EFFECTS; MORPHOLOGY; OXYGEN; PRASEODYMIUM COMPOUNDS; THERMAL EFFECTS;

EID: 0032115679     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(98)00208-1     Document Type: Article
Times cited : (6)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.