X-ray characterization of an Esaki-Tsu superlattice and transport properties

Semiconductor Science and Technology

Volumn 13, Issue 7, 1998, Pages 733-738

  Grenzer, J ^a   Schomburg, E ^a   Lingott, I ^a   Ignatov, A A ^a   Renk, K F ^a   Pietsch, U ^b   Zeimer, U ^c   Melzer, B Ja ^d   Ivanov, S ^d   Schaposchnikov, S ^d   Kop'ev, P S ^d   Pavel'ev, D G ^e   Koschurinov, Yu ^e  

^a UNIVERSITY OF REGENSBURG   (Germany)

^b UNIVERSITY OF POTSDAM   (Germany)

^c LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

^d IOFFE INSTITUTE   (Russian Federation)

^e LOBACHEVSKY STATE UNIVERSITY OF NIZHNY NOVGOROD   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; ELECTRON TRANSPORT PROPERTIES; INTERFACES (MATERIALS); SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR SUPERLATTICES;

INTERFACE ROUGHNESS; SEMICONDUCTING ALUMINUM ARSENIDE;

X RAY SCATTERING;

EID: 0032115032     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/13/7/012     Document Type: Article

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