Fast scanning probe for tokamak plasmas

Review of Scientific Instruments

Volumn 69, Issue 7, 1998, Pages 2663-2670

  Boedo, J ^a   Gray, D ^a   Chousal, L ^a   Conn, R ^a   Hiller, B ^b   Finken, K H ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CALCULATIONS; CARRIER CONCENTRATION; ELECTRONS; FUNCTIONS; PLASMA DIAGNOSTICS; PLASMAS; PNEUMATIC DRIVES; TEMPERATURE; TOKAMAK DEVICES;

FAST SCANNING PROBE; HELIUM BEAM; LAST CLOSED FLUX SURFACE; OHMIC DISCHARGE; SATURATION CURRENT; SCRAPE OFF LAYER;

PLASMA PROBES;

EID: 0032110840     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148995     Document Type: Article

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