Preparation and characterization of single crystals of intercalation compounds CuxTiS2

Materials Research Bulletin

Volumn 33, Issue 7, 1998, Pages 1009-1014

  Kusawake, T ^a   Takahashi, Y ^a   Ohshima, K ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

A. chalcogenides; A. layered compounds; B. intercalation reactions; C. X ray diffraction; D. crystal structure

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL ATOMIC STRUCTURE; ELECTROCHEMISTRY; ELECTROMAGNETIC WAVE REFLECTION; INTERCALATION COMPOUNDS; LATTICE CONSTANTS; SINGLE CRYSTALS; X RAY CRYSTALLOGRAPHY;

CHALCOGENIDE; FULL WIDTH AT HALF MAXIMUM (FWHM); LAYERED COMPOUNDS; X RAY BRAGG REFLECTION;

COPPER COMPOUNDS;

EID: 0032108604     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(98)00030-0     Document Type: Article

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