Scanning probe microscopy investigation of nanometer structures produced by irradiation with 200 MeV ions

Vacuum

Volumn 50, Issue 3-4, 1998, Pages 263-272

  Biro, L P ^a   Gyulai, J ^a   Havancsak, K ^a  

^a INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; ELECTRON ENERGY LEVELS; ELECTRON IRRADIATION; GRAPHITE; MICA; PROBES; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICON; SINGLE CRYSTALS;

MUSCOVITE MICA; PYROLITHIC GRAPHITE; SCANNING PROBE MICROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 0032108539     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(98)00051-7     Document Type: Article

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