In black and white: An integrated approach to class-level testing of object-oriented programs

ACM Transactions on Software Engineering and Methodology

Volumn 7, Issue 3, 1998, Pages 250-295

  Chen, Huo Yan ^a,d   Tse, T H ^b   Chan, F T ^b,e   Chen, T Y ^c  

^a UNIVERSITY OF JINAN   (China)

^b UNIVERSITY OF HONG KONG   (Hong Kong)

^c UNIVERSITY OF MELBOURNE   (Australia)

^d JINAN UNIVERSITY   (China)

^e UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Algorithms; D.2.1 Software Engineering : Requirements Specifications languages; D.2.5 Software Engineering : Testing and Debugging test data generators; D.3.2 Programming Languages : Language Classifications object oriented languages; Languages

Indexed keywords

ALGORITHMS; COMPUTER PROGRAMMING LANGUAGES; EQUIVALENCE CLASSES; GRAPH THEORY; HEURISTIC METHODS; PROGRAM DEBUGGING; SOFTWARE ENGINEERING;

DATA MEMBER RELEVANCE GRAPH; SOFTWARE TESTING; TEST DATA GENERATORS;

OBJECT ORIENTED PROGRAMMING;

EID: 0032108147     PISSN: 1049331X     EISSN: None     Source Type: Journal    
DOI: 10.1145/287000.287004     Document Type: Article

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