Nondestructive inspection using compton scatter tomography

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3 PART 1, 1998, Pages 950-956

  Evans, B L ^a  

^a Michigan Technological University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CARRIER CONCENTRATION; IMAGE QUALITY; IMAGE RECONSTRUCTION; MATHEMATICAL MODELS; NONDESTRUCTIVE EXAMINATION;

BACKPROJECTION ALGORITHM; COMPTON BROADENING; COMPTON SCATTER TOMOGRAPHY; POISSON NOISE;

GAMMA RADIOGRAPHY;

EID: 0032100079     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.682682     Document Type: Article

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