Physical characterization of electron trapping in unibond oxides

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3 PART 3, 1998, Pages 1402-1406

  Gruber, O ^a  

^a DIF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; ELECTRIC FIELDS; IRRADIATION; MATHEMATICAL MODELS; MOSFET DEVICES; OXIDES; POINT CONTACTS; RADIATION EFFECTS; X RAYS;

ELECTRON TRAP; RADIATIVE RESPONSE; THRESHOLD VOLTAGE; UNIBOND OXIDES;

ELECTRON ENERGY LEVELS;

EID: 0032099866     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.685214     Document Type: Article

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