A technique for absolute measurements in near threshold excitation of positive ions: Application to excitation of C+

Measurement Science and Technology

Volumn 9, Issue 6, 1998, Pages 930-938

  Williams, I D ^a   Greenwood, J B ^a,b   Srigengan, B ^a   O'Neill, R W ^a,c   Hughes, I G ^a  

^a QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c ST PATRICK S COLLEGE   (Ireland)

Author keywords

CII; Electron ion; Excitation; Near threshold; Scattering; Trochoidal spectrometer

Indexed keywords

ELECTRON BEAMS; ELECTRON SCATTERING;

NEAR THRESHOLD EXCITATION;

ION BEAMS;

EID: 0032099808     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/9/6/010     Document Type: Article

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