The Use of XPS, FTIR, SEM/EDX, Contact Angle, and AFM in the Characterization of Coatings

Journal of Materials Engineering and Performance

Volumn 7, Issue 3, 1998, Pages 317-323

  Walzak, M J ^a   Davidson, R ^a   Biesinger, M ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

Coatings; Failure analysis; Scanning electron microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; FAILURE ANALYSIS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

COATING CHARACTERIZATION;

COATINGS;

EID: 0032099146     PISSN: 10599495     EISSN: None     Source Type: Journal    
DOI: 10.1361/105994998770347747     Document Type: Article

References (7)

1. C. Marcott, Infrared Spectroscopy, Materials Characterization, Vol 10, Metals Handbook, 9th ed., R. Whan, Ed., American Society for Metals, 1986, p 109-125
2. J.D. Verhoeven, Scanning Electron Microscopy, Materials Characterization, Vol 10, Metals Handbook, 9th ed., R. Whan, Ed., American Society for Metals, 1986, p 490-515
3. J.B. Lumsden, X-Ray Photoelectron Spectroscopy, Materials Characterization, Vol 10, Metals Handbook, 9th ed., R. Whan, Ed., American Society for Metals, 1986, p 568-580
4. R.J. Good, Contact Angle, Wetting and Adhesion: A Critical Review, Contact Angle, Wettability, and Adhesion, K.L. Mittal, Ed., VSP, 1993, p 3-36
5. D. Briggs, Applications of XPS in Polymer Technology, Auger and X-Ray Photoelectron Spectroscopy, Vol 1, Practical Surface Analysis, D. Briggs and M.P. Seah, Ed., John Wiley & Sons, 1990, p 437-480
6. N.S. McIntyre and T.C. Chan, Uses of Auger Electron and Photoelectron Spectroscopies in Corrosion Science, Auger and X-Ray Photoelectron Spectroscopy, Vol 1, Practical Surface Analysis, 2nd ed., D. Briggs and M.P. Seah, Ed., John Wiley & Sons, 1990, p 485-529
7. D.R. Gabe and M. Clarke, Electroplating, Corrosion Control, Vol 2, Corrosion, L.L. Shreir, R.A. Jarman, and G.T. Burstein, Ed., Butterworth Heinemann Ltd., 1994, p 12:41-12:44