Artificial intelligence for instrument & measurement applications

IEEE Instrumentation and Measurement Magazine

Volumn 1, Issue 2, 1998, Pages 9-17

  Alippi, Cesare ^a,b,c,d   Ferrero, Alessandro ^a,d,e   Piuri, Vincenzo ^a,d  

^a POLITECNICO DI MILANO   (Italy)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

^c CNR   (Italy)

^d IEEE   (Italy)

^e UNIVERSITY OF CATANIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; DIGITAL SIGNAL PROCESSING; EXPERT SYSTEMS; FUZZY SETS; MICROPROCESSOR CHIPS; NEURAL NETWORKS;

ABSTRACTION LEVELS;

ARTIFICIAL INTELLIGENCE;

EID: 0032099119     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: 10.1109/5289.685492     Document Type: Article

References (8)

1. S. Haykin, Neural Networks: A Comprehensive Foundation, New York: McMillan and IEEE Computer Society, 1994.
2. D.T. Pham and X. Liu, Neural Networks for Identification, Prediction and Control, London: Springer-Verlag, 1995.
3. R. Linggard, D.J. Myers, and C. Nightngale, eds., Neural Networks for Vision, Speech and Natural Language, London: Chapman & Hall, 1992.
4. H. J. Zimmermann, Fuzzy Set Theory and its Applications, 2nd ed., Boston: Kluwer Academic Publishers, 1991.
5. R.J. Marks II, Fuzzy Logic Technology and Application IEEE Press, 1994.
6. B. Kosko, Neural Networks and Fuzzy Systems, Englewood Cliffs, NJ: Prentice-Hall, 1992.
7. D. Nebendahl, Expert systems: Introduction to the technology and applications, New York: John Wiley & Sons, 1988.
8. C. Alippi, V. Piuri, "A selected bibliography on artificial intelligence techniques in instrumentation and measurement applications," http://www.ims.unico.it/tech_com/tc-22/techinfo/biblio.html, 1997.