Scanning tunneling microscopy on Sn/Si(110) system

Applied Surface Science

Volumn 130-132, Issue , 1998, Pages 118-122

  An, Toshu ^a   Yoshimura, Masamichi ^a   Ueda, Kazuyuki ^a  

^a TOYOTA TECHNOLOGICAL INSTITUTE   (Japan)

Author keywords

Crystal growth; Si(110); Sn; STM; Superstructure

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL GROWTH; CRYSTAL ORIENTATION; IMAGE ANALYSIS; MONOMERS; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACE STRUCTURE; TIN;

CLUSTER PROTRUSION; SURFACE SUPERSTRUCTURE;

SEMICONDUCTOR METAL BOUNDARIES;

EID: 0032098975     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00036-1     Document Type: Article

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