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Volumn 45, Issue 3 PART 1, 1998, Pages 1009-1013

Evaluation of surveillance test interval from risk viewpoint

Author keywords

[No Author keywords available]

Indexed keywords

CORE MELTDOWN; ELECTRIC CIRCUIT BREAKERS; ELECTRIC EQUIPMENT PROTECTION; ERRORS; FAILURE ANALYSIS; MATHEMATICAL MODELS; PROBABILITY; RISK ASSESSMENT; SENSITIVITY ANALYSIS; TRANSIENTS;

EID: 0032098929     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.682698     Document Type: Article
Times cited : (7)

References (7)
  • 1
    • 33747272882 scopus 로고    scopus 로고
    • "Quantitative Evaluation of Surveillance Test Intervais Including Test-Caused Risks," 5775 (1991).
    • IS. Kim, S. Martorell, W.E. Vesely, and P.K. Samanta, "Quantitative Evaluation of Surveillance Test Intervais Including Test-Caused Risks," NUREG/CR-5775 (1991).
    • NUREG/CR
    • Kim, I.S.1    Martorell, S.2    Vesely, W.E.3    Samanta, P.K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.