Surface characterization of a potential photoactive LC coupling agent

Thin Solid Films

Volumn 323, Issue 1-2, 1998, Pages 42-52

  Mouanda, B ^a   Viel, P ^a   Blanche, C ^b  

^a CEA SACLAY   (France)

^b SERVICE DE PHYSIQUE DE L ETAT CONDENSÉ   (France)

Author keywords

Alkoxysilanes; Fourier transform infrared spectroscopy (FTIR); X ray photoelectron spectroscopy (XPS); X ray reflectivity

Indexed keywords

AZO DYES; CRYSTAL STRUCTURE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); REACTION KINETICS; SILANES; SILICON WAFERS; X RAY PHOTOELECTRON SPECTROSCOPY;

X RAY REFLECTIVITY;

LIQUID CRYSTALS;

EID: 0032098886     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01040-7     Document Type: Article

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