LEED structural determination of the c(2 x 2) Si/Cu(110) surface alloy

Surface Science

Volumn 407, Issue 1-3, 1998, Pages 268-274

  Polop, C ^a   Rojas, C ^a   Roman, E ^a   Martin Gago J A ^a   Brena, B ^b   Cocco, D ^b   Paolucci, G ^b  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b SINCROTRONE TRIESTE   (Italy)

Author keywords

Copper; Low energy electron diffraction; Metal semiconductor interfaces; Silicon; Surface structure

Indexed keywords

COPPER; DEPOSITION; INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; SILICON;

INTERLAYER SPACING; SUPERSTRUCTURE;

SURFACE STRUCTURE;

EID: 0032098674     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00205-2     Document Type: Article

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