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Volumn 34, Issue 12, 1998, Pages 1222-1224
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One-port S-parameter measurements using quasi-optical multistate reflectometer
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Author keywords
[No Author keywords available]
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Indexed keywords
BANDWIDTH;
ELECTRIC NETWORK ANALYZERS;
REFLECTOMETERS;
QUASI-OPTICAL MULTISTATE REFLECTOMETERS;
ELECTROMAGNETIC FIELD MEASUREMENT;
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EID: 0032098163
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19980879 Document Type: Article |
Times cited : (3)
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References (6)
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