Evaluating the Performance of Semiconductor Radiation Detectors Through Static Charge Analysis

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3, 1998, Pages 1723-1725

  Lingren, C L ^a   Butler, J F ^a  

^a Digirad Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC CHARGE; ELECTROCHEMICAL ELECTRODES; GAMMA RAYS; NUMERICAL ANALYSIS; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR DEVICES;

ALTERNATIVE ELECTRODE CONFIGURATIONS; CADMIUM ZINC TELLURIDE; GAMMA RAY DETECTORS; HECHT EQUATION; STATIC CHARGE ANALYSIS; TRAPPED CHARGE SCREENING;

RADIATION DETECTORS;

EID: 0032098147     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.685294     Document Type: Article

References (10)

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