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Volumn 5, Issue 3, 1998, Pages 408-420

Optimization of multi-wavelength interdigital dielectrometry instrumentation and algorithms

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CALIBRATION; COMPUTATIONAL GEOMETRY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC FREQUENCY MEASUREMENT; FINITE ELEMENT METHOD; GAIN MEASUREMENT; OPTIMIZATION; PERMITTIVITY MEASUREMENT; PHASE MEASUREMENT; SENSORS; SHORT CIRCUIT CURRENTS;

EID: 0032097438     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.689431     Document Type: Article
Times cited : (46)

References (23)
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  • 2
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    • Continuum Properties from Interdigital Electrode Dielectrometry
    • December
    • M. C. Zaretsky, L. Mouayad and J. R. Melcher, "Continuum Properties from Interdigital Electrode Dielectrometry", IEEE Transactions on Electrical Insulation, Vol. 23, No. 6, pp. 897-917, December 1988.
    • (1988) IEEE Transactions on Electrical Insulation , vol.23 , Issue.6 , pp. 897-917
    • Zaretsky, M.C.1    Mouayad, L.2    Melcher, J.R.3
  • 3
    • 0024946850 scopus 로고
    • Moisture Sensing in Transformer Oil Using Thin-Film Microdielectrometry
    • Dec.
    • M. C. Zaretsky, J. R. Melcher and C. M. Cooke, "Moisture Sensing in Transformer Oil Using Thin-Film Microdielectrometry", IEEE Transactions on Electrical Insulation, Vol. 24, no. 6, pp. 1167-1176, Dec. 1989.
    • (1989) IEEE Transactions on Electrical Insulation , vol.24 , Issue.6 , pp. 1167-1176
    • Zaretsky, M.C.1    Melcher, J.R.2    Cooke, C.M.3
  • 4
    • 0024917979 scopus 로고
    • Estimation of Thickness, Complex Bulk Permittivity and Surface Conductivity Using Interdigital Dielectrometry
    • Dec.
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    • (1989) IEEE Transactions on Electrical Insulation , vol.24 , Issue.6 , pp. 1159-1166
    • Zaretsky, M.C.1    Li, P.2    Melcher, J.R.3
  • 9
  • 11
    • 0029705588 scopus 로고    scopus 로고
    • Moisture Dynamic Measurements of Transformer Board Using a Three-Wavelength Dielectrometry Sensor
    • Montreal, Quebec, Canada, June 16-19
    • Y. Du, M. Zahn, A. V. Mamishev and D. E. Schlicker, "Moisture Dynamic Measurements of Transformer Board Using A Three-Wavelength Dielectrometry Sensor", 1996 IEEE International Symposium on Electrical Insulation, Montreal, Quebec, Canada, pp. 53-56, June 16-19, 1996.
    • (1996) 1996 IEEE International Symposium on Electrical Insulation , pp. 53-56
    • Du, Y.1    Zahn, M.2    Mamishev, A.V.3    Schlicker, D.E.4
  • 12
    • 0004170562 scopus 로고
    • User's Reference, Ansoft Corporation, June
    • Maxwell 2D Field Simulator, User's Reference, Ansoft Corporation, June 1994.
    • (1994) Maxwell 2D Field Simulator
  • 14
    • 0029272419 scopus 로고
    • Estimation of One-Dimensional Complex-Permittivity Profiles: A Feasibility Study
    • March
    • P. A. von Guggenberg and M. C. Zaretsky, "Estimation of One-Dimensional Complex-Permittivity Profiles: a Feasibility Study", Journal of Electrostatics, Vol. 34, no. 2-3, pp. 263-277, March 1995.
    • (1995) Journal of Electrostatics , vol.34 , Issue.2-3 , pp. 263-277
    • Von Guggenberg, P.A.1    Zaretsky, M.C.2
  • 17
    • 0029531793 scopus 로고
    • Measurement of Dielectric Property Distributions Using Interdigital Dielectrometry Sensors
    • Virginia Beach, VA, October
    • A. V. Mamishev, Y. Du and M. Zahn, "Measurement of Dielectric Property Distributions Using Interdigital Dielectrometry Sensors", IEEE Conference on Electrical Insulation and Dielectric Phenomena, Virginia Beach, VA, pp. 309-312, October 1995.
    • (1995) IEEE Conference on Electrical Insulation and Dielectric Phenomena , pp. 309-312
    • Mamishev, A.V.1    Du, Y.2    Zahn, M.3
  • 18
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    • Techniques for Semi-Empirical Characterization of Material and Sensor Properties in Interdigital Dielectrometry
    • Montreal, Canada
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    • Mamishev, A.V.1    Zahn, M.2
  • 21
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    • Accurate, Wide Range Design Equations for the Frequency Dependent Characteristics of Parallel Coupled Microstrip Lines
    • January
    • M. Kirsching and R. H. Jansen, "Accurate, Wide Range Design Equations for the Frequency Dependent Characteristics of Parallel Coupled Microstrip Lines", IEEE Transactions on Microwave Theory Tech., Vol. MTT-32, pp. 83-90, January 1984.
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    • Kirsching, M.1    Jansen, R.H.2
  • 22
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    • Annual Book of ASTM Standards, D150-81


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.