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Volumn 226, Issue 3, 1998, Pages 281-286
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Subcritical crack growth in Y-Al-Si-O-N glass
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Author keywords
[No Author keywords available]
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Indexed keywords
CRACK PROPAGATION;
NITRIDES;
REACTION KINETICS;
STRESS ANALYSIS;
CANTILEVER BEAM TECHNIQUE;
OXYNITRIDE GLASS;
GLASS;
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EID: 0032097303
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(98)00454-2 Document Type: Article |
Times cited : (12)
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References (25)
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