Dependence of electric field on STM tip preparation

Applied Surface Science

Volumn 130-132, Issue , 1998, Pages 909-913

  Huang, D H ^a   Grey, F ^a   Aono, M ^a  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; SURFACE TREATMENT;

TIP DISPLACEMENT; TIP PREPARATION;

SCANNING TUNNELING MICROSCOPY;

EID: 0032097068     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00175-5     Document Type: Article

References (11)

1. R.S. Becker J.A. Golovchenko B.S. Swartzentruber Nature 325 1987 419
2. D.M. Eigler E.K. Schweizer Nature 344 1990 524
3. I.-W. Lyo Ph. Avouris Science 253 1991 173
4. S. Hosoki S. Hosaka T. Hasegawa Appl. Surf. Sci. 60/61 1992 2418
5. D.H. Huang H. Uchida M. Aono Jpn. J. Appl. Phys. 31 1992 4501
6. H. Uchida D.H. Huang F. Grey M. Aono Phys. Rev. Lett. 70 1993 2040
7. D.H. Huang H. Uchida M. Aono J. Vac. Sci. Technol. B 12 1994 2429
8. A. Kobayashi F. Grey S. Williams M. Aono Science 259 1993 1724
9. F. Grey, A. Kobayashi, H. Uchida, D.H. Huang, M. Aono, in: C.R.K. Marrian (Ed.), Technology of Proximal Probe Lithography, SPIE Optical Engineering Press, WA, USA, 1993 p. 74.
10. F. Grey D.H. Huang M. Aono Philos. Mag. B 70 1994 711
11. J.G. Simmons J. Appl. Phys. 34 1963 2581