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Volumn 130-132, Issue , 1998, Pages 815-821
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New development of a high-resolution scanning ESD system for two-dimensional images of hydrogen and its applications
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON GUNS;
LOW ENERGY ELECTRON DIFFRACTION;
MASS SPECTROMETRY;
SURFACE MEASUREMENT;
SURFACE PROPERTIES;
ELECTRON STIMULATED DESORPTION (ESD);
SCANNING AUGER ELECTRON MICROSCOPY;
SCANNING PROBE MICROSCOPY;
THERMAL FIELD EMISSION (TFE) ELECTRON GUN;
HYDROGEN;
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EID: 0032096917
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(98)00159-7 Document Type: Article |
Times cited : (3)
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References (15)
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