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Volumn 83, Issue 12, 1998, Pages 7678-7684

Degradation of commercial high-brightness GaP:N green light emitting diodes

Author keywords

[No Author keywords available]

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; DEGRADATION; ELECTRIC CURRENTS; ELECTROLUMINESCENCE; OPTICAL VARIABLES MEASUREMENT; PHOSPHORUS; SEMICONDUCTING GALLIUM COMPOUNDS; SILICON;

EID: 0032096876     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367889     Document Type: Article
Times cited : (12)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.