Electron density measurements during microwave generation in a high power backward-wave oscillator

IEEE Transactions on Plasma Science

Volumn 26, Issue 3, 1998, Pages 275-281

  Hegeler, Frank ^a   Grabowski, Chris ^a   Schamiloglu, Edl ^a  

^a University of New Mexico   (United States)

Author keywords

Backward wave oscillator; High power microwave generation; Michelson laser interferometry; Plasma diagnostics; Pulse shortening

Indexed keywords

CARRIER CONCENTRATION; ELECTRON BEAMS; ELECTRON SOURCES; INTERFEROMETRY; IONIZATION OF GASES; LASER APPLICATIONS; MICROWAVE GENERATION; MICROWAVE OSCILLATORS; PLASMA DIAGNOSTICS; VACUUM APPLICATIONS;

BACKWARD WAVE OSCILLATORS; MICHELSON LASER INTERFEROMETRY; PULSE SHORTENING; SLOW WAVE STRUCTURES (SWS);

PLASMA DENSITY;

EID: 0032096746     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/27.700754     Document Type: Article

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