X-ray dual-energy calibration based on estimated spectral properties of the experimental system

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3 PART 4, 1998, Pages 1699-1712

  Hassler, U ^a   Garnero, L ^a,b   Rizo, P ^a  

^a FRAUNHOFER INSTITUTE FOR INTEGRATED CIRCUITS IIS   (Germany)

^b CNRS   (France)

Author keywords

Calibration; Dual energy; Spectral sensibility; Spectrum estimation; X ray tomography

Indexed keywords

ATTENUATION; CALIBRATION; MATHEMATICAL MODELS; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; SCINTILLATION COUNTERS; SPECTRUM ANALYSIS; X RAYS;

ATTENUATION MEASUREMENT; SPECTRAL SENSIBILITY; X RAY DUAL ENERGY CALIBRATION; X RAY TOMOGRAPHY;

COMPUTERIZED TOMOGRAPHY;

EID: 0032096112     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.685292     Document Type: Article

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