Error analysis and planning accuracy for dimensional measurement in active vision inspection

IEEE Transactions on Robotics and Automation

Volumn 14, Issue 3, 1998, Pages 476-487

  Yang, Christopher C ^a,b   Marefat, Michael M ^a,c   Ciarallo, Frank W ^a,c  

^a IEEE   (Hong Kong)

^b UNIVERSITY OF HONG KONG   (Hong Kong)

^c UNIVERSITY OF ARIZONA   (United States)

Author keywords

Active vision; Computer integrated inspection; Dimensional inspection; Displacement error; Error analysis; Image understanding; Quantization error; Scene analysis; Three dimensional vision

Indexed keywords

ERROR ANALYSIS; IMAGE UNDERSTANDING; INSPECTION; PROBABILITY DENSITY FUNCTION;

COMPUTER INTEGRATED INSPECTION; DIMENSIONAL INSPECTION;

COMPUTER VISION;

EID: 0032095658     PISSN: 1042296X     EISSN: None     Source Type: Journal    
DOI: 10.1109/70.678456     Document Type: Article

References (36)

1. D. H. Ballard and C. M. Brown, Computer Vision. Englewood Cliffs, NJ: Prentice-Hall, 1982.
2. S. D. Blostein and T. S. Huang, "Error analysis in stereo determination of 3-D point positions," IEEE Trans. Pattern Anal. Machine Intell., vol. PAMI-9, Nov, 1987.
3. S. Bryson, "Measurement and calibration of static distortion of position data from 3-D trackers," in Proc. SPIE Stereoscopic Displays and Applications III, 1992, vol. 166.
4. J. Chen and L. M. Chao, "Positioning error analysis for robot manipulators with all rotary joints," IEEE Int. Conf. Robot. Automat., San Francisco, CA, Apr. 1986.
5. R. T. Chin, "Survey automated visual inspection: 1981-1987," Comput. Vision, Graph., Image Processing, vol. 41, pp. 346-381, 1988.
6. C. K. Cowan, "Automated sensor placement for vision task requirements," IEEE Trans. Pattern Anal. Machine Intell., vol. PAMI-10, 1988.
7. K. Crosby, C. C. Yang, M. M. Marefat, and F. W. Ciarallo, "Optimization of sensor placement with camera constraints," in Proc. IEEE Int. Conf. Robot. Automat., Albuquerque, NM, Apr. 20-25, 1997.
8. D. F. James and V. D. Andries, Computer Graphics Principles and Practices. Reading, MA: Addison-Wesley, 1990.
9. P. M. Griffin and J. R. Villalobos, "Process capability of automated visual inspection systems," IEEE Trans. Syst., Man, Cybern., vol. 22, May/June 1992.
10. D. I. Hayclock, "Geometric precision in noise-free digital images," IEEE Trans. Pattern Anal. Machine Intell., vol. 11, pp. 1065-1075, 1989.
11. C. Ho, "Precision of digital vision systems," IEEE Trans. Pattern Anal. Machine Intell., vol. PAMI-5, Nov. 1983.
12. A. Huertas and C. Medioni, "Detection of intensity changes with subpixel accuracy using Laplacian-Gaussian masks," IEEE Trans. Pattern Anal. Machine Intell., vol. PAMI-8, Sept. 1986.
13. S. A. Hutchinson, R. L. Cronwell, and A. C. Kak, "Planning sensing strategies in robot work cell with multi-sensor capabilities," IEEE Trans. Robot. Automat., vol. 5, 1989.
14. K. Jensen and D. Anastassiou, "Subpixel edge localization and the interpolation of still images," IEEE Trans. Image Processing, vol. 4, Mar. 1995.
15. B. Kamgar-Parsi and B. Kamgar-Parsi, "Evaluation of quantization error in computer vision," IEEE Trans. Pattern Anal. Machine Intell., vol. 11, Sept. 1989.
16. M. Kisworo, S. Venkatesh, and G. West, "Modeling edges at subpixel accuracy using the local energy approach," IEEE Trans. Pattern Anal. Machine Intell., vol. 16, Apr. 1994.
17. E. Lyvers, O. R. Mitchell, M. L. Akey, and A. P. Reeves, "Subpixel measurements using a moment-based edge operator," IEEE Trans. Pattern Anal. Machine Intell., vol. 11, Dec. 1989.
18. P. J. MacVicar-Whelan and T. O. Binford, "Line finding with subpixel precision," in Proc. SPIE Techniques Appl. Image Understanding, 1981, vol. 281.
19. M. M. Marefat and R. L. Kashyap, "Image interpretation and object recognition in manufacturing," IEEE Contr. Syst., vol. 11, Aug. 1991.
20. _, "Feature-based computer integrated inspection," in Proc. 1993 ASME Int. Comput. Eng. Conf., San Diego, CA, Aug. 8-12, 1993.
21. C. H. Menq and J. H. Borm, "Statistical measure and characterization of robot errors," in Proc. IEEE Int. Conf. Robot. Automat., 1988.
22. C. H. Menq, H. T. Yau, and G. Y. Lai, "Automated precision measurement of surface profile in CAD-directed inspection," IEEE Trans. Robot. Automat., vol. 8, Apr. 1992.
23. C. W. Moon, "Error analysis for dimensional measurement using computer vision techniques," IEEE Instrum. Meas. Technol. Conf., San Diego, CA, 1988, pp. 371-376.
24. H. D. Park and O. R. Mitchell, "CAD based planning and execution of inspection," in Proc. IEEE Comput. Vision Pattern Recog. Conf., Ann Arbor, MI, 1988.
25. R. P. Paul, Differential Relationships, Robot Manipulators: Mathematics, Programming, and Control. Cambridge, MA: MIT Press, 1989, ch. 4.
26. G. M. Radack and F. L. Merat, "The integration of inspection into the CIM environment," in Proc. Hawaii Int. Conf. Syst. Sci., 1990, pp. 445-462.
27. J. Renders, E. Rossignol, M. Becquet, and R. Hanus, "Kinematic calibration and geometrical parameter identification for robots," IEEE Trans. Robot. Automat., vol. 7, Dec. 1991.
28. S. Yi, R. M. Haralick, L. Shapiro, "Automatic sensor and light source positioning for machine vision," in Proc. 10th Int. Conf. Pattern Recog., Alantic City, NJ, June 2-3, 1991.
29. R. C. Smith and P. Chessman, "On the representation and estimation of spatial uncertainty," Int. J. Robot. Res., vol 5, no. 4, 1986.
30. S. F. Su and C. S. G. Lee, "Manipulation and propagation of uncertainty and verification of application of actions in assembly tasks," IEEE Trans. Syst., Man, Cybern., vol. 22, Nov./Dec. 1992.
31. W. K. Veitschegger and C. Wu, "A method for calibrating and compensating robot kinematic errors," in Proc. IEEE Int. Conf. Robot. Automat., 1987.
32. Z. Yan and C. H. Menq, "Coordinate sampling and uncertainty analysis for computer integrated manufacturing and dimension inspection," in Proc. 1993 NSF Design Manufact. Syst. Conf., Charlotte, NC, Jan. 6-8, 1993, pp. 1705-1711.
33. C. C. Yang, M. M. Marefat, and R. L. Kashyap, "Active visual inspection on CAD models," IEEE Int. Conf. Robot. Automat., San Diego, CA, May 8-13, 1994.
34. _, "Analysis of errors in dimensional inspection based on active vision," in Proc. SPIE Int. Symp. Intell. Robot Comput. Vision XIII: 3-D Vision, Product Inspection, Active Vision, Cambridge, MA, Oct. 31-Nov. 4, 1994.
35. K. Tarabanis, R. Y. Tsai, and P. K. Allen, "Analytic characterization of the feature detectability constraints of resolution, focus, and field-of-view for vision sensor planning," CVGIP: Image Understanding, vol. 59, no. 3, pp. 3400-358, May 1994.
36. _, "The MVP sensor planning system for robotic vision tasks," IEEE Trans. Robot. Automat., vol. 11, Feb. 1995.