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Volumn 45, Issue 3 PART 1, 1998, Pages 390-393

The influence of the M-π-n structure on CdTe X-Ray detector performance

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; LEAKAGE CURRENTS; PERFORMANCE; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; X RAYS;

EID: 0032095212     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.682414     Document Type: Article
Times cited : (10)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.