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Volumn 45, Issue 3 PART 1, 1998, Pages 626-631

Average depths of electron penetration: use as characteristic depths of exposure

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRON BEAMS; ELECTRONS; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; RADIATION EFFECTS;

EID: 0032094999     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.682461     Document Type: Article
Times cited : (23)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.