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Volumn 42, Issue 5, 1998, Pages 493-498
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Comparison of spatial point patterns and processes characterization methods
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0032094536
PISSN: 02955075
EISSN: None
Source Type: Journal
DOI: 10.1209/epl/i1998-00279-7 Document Type: Article |
Times cited : (17)
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References (30)
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