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Physica B: Condensed Matter

Volumn 248, Issue 1-4, 1998, Pages 263-268

The interface structure of thin liquid hexane films

(4) Doerr, A K a Tolan, M a Seydel, T a Press, W a

a UNIVERSITY OF KIEL (Germany)

Author keywords

Inversion techniques; Liquid surface; Thin films

Indexed keywords

ADSORPTION; HYDROCARBONS; PHASE INTERFACES; SILICON WAFERS; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS; X RAY ANALYSIS;

THIN LIQUID HEXANE FILMS; X RAY SCATTERING;

SEMICONDUCTING FILMS;

EID: 0032093802 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-4526(98)00245-2 Document Type: Article

Times cited : (47)

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