Testing the GP-B telescope readout electronics on a flight quality telescope

Journal De Physique. IV : JP

Volumn 8, Issue 3, 1998, Pages

  Wang, S ^a   Gwo, D H ^a   Bower, K A ^a   Huff, L W ^a   Kirschman, R K ^a,b   Lipa, J A ^a   Jhabvala, M ^c   Babu, S ^d   Das, N ^a  

^a STANFORD UNIVERSITY   (United States)

^b Goddard Space Flight Center ^*

^c BALL AEROSPACE AND TECHNOLOGIES CORP   (United States)

^d HUGHES STX CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CRYOGENIC EQUIPMENT; JUNCTION GATE FIELD EFFECT TRANSISTORS; PHOTODIODES; READOUT SYSTEMS; SEMICONDUCTING SILICON;

CRYOGENIC STAR TRACKING TELESCOPES; FLIGHT QUALITY TELESCOPES; TELESCOPE READOUT ELECTRONICS;

OPTICAL TELESCOPES;

EID: 0032093727     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (3)

1. Schiff L.I., Phy. Rev. Lett., 4, (1960) 215-217.
2. Goldberg R.T., et al, "Fabrication and Characterization of Low-Noise Cryogenic Si JFETs" The Electrochemical Society Proceedings, 95-9, (1995) pp. 428-439.
3. Wang S., et al, "A Cryogenic Optical Telescope for Inertial Pointing in the Milli-arc-sec Range", Czech. J. Phy., 46, (1996) pp. 2733-2734.