Strain relaxation in thin films of Cu grown on Ni(0 0 1)

Physica B: Condensed Matter

Volumn 248, Issue 1-4, 1998, Pages 34-38

  Rasmussen, Frank Berg ^a   Baker, Jeff ^a   Nielsen, Mourits ^a   Feidenhans'l, Robert ^a   Johnson, Robert L ^b  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b NONE

Author keywords

Nanoclusters; Strain relaxation; X ray diffraction

Indexed keywords

COPPER; CRYSTAL ORIENTATION; FILM GROWTH; INTERFACES (MATERIALS); KINEMATICS; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; NICKEL; STRAIN; STRESS RELAXATION; THIN FILMS; X RAY CRYSTALLOGRAPHY;

SURFACE X RAY DIFFRACTION (SXRD) ANALYSIS;

METALLIC FILMS;

EID: 0032093577     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-4526(98)00199-9     Document Type: Article

References (6)

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