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Volumn 152, Issue 1-3, 1998, Pages 19-22

A new optical configuration in speckle interferometry for contouring of three-dimensional objects

Author keywords

Contouring; Speckle interferometry

Indexed keywords

EDGE DETECTION; IMAGE ANALYSIS; IMAGING SYSTEMS; SENSITIVITY ANALYSIS; SPECKLE; THREE DIMENSIONAL COMPUTER GRAPHICS;

EID: 0032092837     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(98)00159-X     Document Type: Article
Times cited : (8)

References (13)
  • 11
    • 0004044474 scopus 로고    scopus 로고
    • Chap. 2
    • P.K. Rastogi, Chap. 2, p. 41; R.S. Sirohi, Chap. 3, p. 99, in: R.S. Sirohi (Ed.), Speckle Metrology, Marcel Dekker, New York, 1993.
    • Speckle Metrology , pp. 41
    • Rastogi, P.K.1
  • 12
    • 0001816034 scopus 로고
    • Chap. 3, R.S. Sirohi (Ed.), Marcel Dekker, New York
    • P.K. Rastogi, Chap. 2, p. 41; R.S. Sirohi, Chap. 3, p. 99, in: R.S. Sirohi (Ed.), Speckle Metrology, Marcel Dekker, New York, 1993.
    • (1993) Speckle Metrology , pp. 99
    • Sirohi, R.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.