Infra-red emission characterization of polycrystalline diamond films

Diamond and Related Materials

Volumn 7, Issue 6, 1998, Pages 789-793

  Ayres, V M ^a   McCormick, T ^b   Alexander, W B ^c   Vestyck Jr , D J ^d   Butler, I E ^e   Spiberg, P ^f  

^a Michigan State University   (United States)

^b INTERSIL CORPORATION   (United States)

^c MEMC Electronic Materials Inc   (United States)

^d SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

^e NAVAL RESEARCH LABORATORY   (United States)

^f ECR Corporation   (United States)

Author keywords

Defect; Infra red; Photoluminescence; Raman spectroscopy

Indexed keywords

CRYSTAL DEFECTS; INFRARED RADIATION; PHOTOLUMINESCENCE; POLYCRYSTALS; RAMAN SPECTROSCOPY; SPECTRUM ANALYSIS;

EMISSION SPECTRA;

DIAMOND FILMS;

EID: 0032092225     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(97)00320-8     Document Type: Article

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