Sensitivity of magnetic X-ray dichroism for chemical order in MBE-grown FEPD layers

Physica B: Condensed Matter

Volumn 248, Issue 1-4, 1998, Pages 127-132

  Kamp, P ^a,e   Belakhovsky, M ^a   Boeglin, C ^b   Durr H A ^c   Van Der Laan, G ^c   Schille, P ^c   Rogalev, A ^d   Goulon, J ^d   Gehanno, V ^a   Marty, A ^a   Gilles, B ^a  

^a CEA GRENOBLE   (France)

^b INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

^c DARESBURY LABORATORY   (United Kingdom)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^e HEINRICH HEINE UNIVERSITY   (Germany)

Author keywords

Binary magnetic alloys; Chemical order; Magnetic circular X ray dichroism; MBE grown films; Perpendicular magnetic anisotropy

Indexed keywords

BINARY ALLOYS; ELECTROMAGNETIC WAVE POLARIZATION; MAGNETIC ANISOTROPY; MAGNETIC MOMENTS; MAGNETIC THIN FILMS; METALLIC FILMS; MOLECULAR BEAM EPITAXY; ORDER DISORDER TRANSITIONS; X RAYS;

CHEMICAL ORDER; MAGNETIC CIRCULAR X RAY DICHROISM (MCXD);

IRON ALLOYS;

EID: 0032092133     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(98)00218-X     Document Type: Article

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