Modeling X-ray patterns and TEM images of MCM-41

Microporous and Mesoporous Materials

Volumn 22, Issue 1-3, 1998, Pages 485-493

  Schacht, S ^a   Janicke, M ^a   Schuth F ^a  

^a GOETHE UNIVERSITY   (Germany)

Author keywords

MCM 41; Modelling; Transmission electron microscopy; X ray diffraction

Indexed keywords

AMORPHOUS MATERIALS; COMPUTER SIMULATION; CRYSTAL DEFECTS; PORE SIZE; POROSITY; POROUS MATERIALS; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

MESOPOROUS SILICA; PORE SHAPE;

FUSED SILICA;

EID: 0032091359     PISSN: 13871811     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1387-1811(98)00086-9     Document Type: Article

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