On the reflectivity of reactively sputtered Ni/Ti multilayers

Physica B: Condensed Matter

Volumn 248, Issue 1-4, 1998, Pages 53-55

  Senthil Kumar, M ^a   Boni P ^a   Tixier, S ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Interfaces; Neutron supermirror; Ni Ti multilayer; Reflectivity

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE SCATTERING; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); METALLIC FILMS; NEUTRON REFLECTION; NICKEL; SPUTTERING; SURFACE ROUGHNESS; TITANIUM; X RAY ANALYSIS;

NEUTRON SUPERMIRRORS; REACTIVE SPUTTERING; X RAY DIFFUSE SCATTERING ANALYSIS; X RAY REFLECTIVITY ANALYSIS;

METALLIC SUPERLATTICES;

EID: 0032090329     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(98)00202-6     Document Type: Article

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