Identification of surface atoms of LiGaO2(001) substrate for hexagonal GaN film by coaxial impact collision ion scattering spectroscopy

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 37, Issue 6 A, 1998, Pages

  Ishii, Takao ^a   Mukaida, Masashi ^a   Nishihara, Takaharu ^a   Hayashi, Shigeki ^a   Shinohara, Makoto ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTRON SPECTROSCOPY; FILM GROWTH; OXIDES; SEMICONDUCTING GALLIUM COMPOUNDS; SINGLE CRYSTALS; SUBSTRATES; SURFACES; THIN FILMS;

COAXIAL IMPACT COLLISION ION SCATTERING SPECTROSCOPY; GALLIUM NITRIDE; LITHIUM GALLIDE;

CRYSTAL ATOMIC STRUCTURE;

EID: 0032090209     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.l672     Document Type: Article

References (9)