Photoluminescence efficiency of semiconductor-microcavity-polaritons far from resonance

Solid State Communications

Volumn 106, Issue 11, 1998, Pages 711-714

  Wainstain, J ^a   Delalande, C ^a   Voos, M ^a   Bloch, J ^b   Thierry Mieg, V ^b   Planel, R ^b   Houdre R ^c   Stanley, R P ^c   Oesterle, U ^c  

^a ECOLE NORMALE SUPÉRIEURE   (France)

^b CNRS   (France)

^c EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

MIRRORS; RELAXATION PROCESSES; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR QUANTUM WELLS; THERMAL EFFECTS;

POLARITON; QUANTUM WELL EXCITATION MODE; SEMICONDUCTOR MICROCAVITY STRUCTURE;

PHOTOLUMINESCENCE;

EID: 0032090011     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(98)00132-X     Document Type: Article

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