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Volumn 410, Issue 1, 1998, Pages
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Proceedings of the 1997 5th International Workshop on GaAs Detectors and Related Compounds
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
PARTICLE DETECTORS;
RADIATION DAMAGE;
RADIATION HARDENING;
REMOTE READOUTS;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTOR COUNTERS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICE MODELS;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR DEVICE TESTING;
EIREV;
ENERGY RESOLUTION;
HADRONS;
MICROSTRIP DETECTORS;
NONIONIZING ENERGY LOSSES;
PIONS;
PIXEL DETECTORS;
SEMICONDUCTOR DETECTORS;
THERMALLY STIMULATED CURRENTS (TSC);
THERMALLY STIMULATED DEPOLARIZATION (TSD);
NUCLEAR INSTRUMENTATION;
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EID: 0032089477
PISSN: 01689002
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Review |
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Times cited : (1)
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References (0)
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