Cryogenic amplification system for ultra-low noise measurements

Journal De Physique. IV : JP

Volumn 8, Issue 3, 1998, Pages

  Lombardi, G ^a   Macucci, M ^a   Giannetti, R ^a   Pellegrini, B ^a  

^a UNIVERSITY OF PISA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION; CRYOGENIC EQUIPMENT; SHOT NOISE; SIGNAL NOISE MEASUREMENT; THERMOANALYSIS;

DOUBLE BARRIER RESONANT TUNNELING DEVICES; ULTRA LOW NOISE CRYOGENIC AMPLIFIERS;

AMPLIFIERS (ELECTRONIC);

EID: 0032089467     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1998340     Document Type: Article

References (3)

1. M. Macucci and B. Pellegrini: "Very Sensitive Measurement Method of Electron Device Current Noise", IEEE Transactions on Instrumentation and Measurement 40 (1), 7 (1991).
2. G. Iannaccone, G. Lombardi, M. Macucci, and B. Pellegrini, "Enhanced shot noise in resonant tunneling: theory and experiment," Phys. Rev. Lett 80, 1054 (1998).
3. C. D. Motchenbacher, J. A. Connelly, "Low noise electronic system design," p. 45, Wiley, (New York, 1993).