Measurement of critical micelle concentration of nonionic surfactant solutions using impedance spectroscopy technique

Review of Scientific Instruments

Volumn 69, Issue 6, 1998, Pages 2514-2520

  Chang, Hong Chi ^a   Hwang, Bing Joe ^a   Lin, Yi Yung ^a   Chen, Li Jen ^b   Lin, Shi Yow ^a  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL MICELLE CONCENTRATION; ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE MEASUREMENT; EQUIVALENT CIRCUITS; SOLUTIONS; SPECTROMETERS; SURFACE ACTIVE AGENTS;

IMPEDANCE SPECTROMETER; NONIONIC SURFACTANT SOLUTIONS;

SPECTROSCOPY;

EID: 0032085738     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148951     Document Type: Article

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