Testing exponentiality of the residual life, based on dynamic kullback-leibler information

IEEE Transactions on Reliability

Volumn 47, Issue 2, 1998, Pages 197-201

  Ebrahimi, Nader ^a  

^a NORTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

Consistent test; Entropy; Exponential distribution; Gamma distribution; Kullback Leibler information; Monte Carlo simulation; Weibull distribution

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; LIFE CYCLE; MONTE CARLO METHODS; STATISTICAL TESTS; WEIBULL DISTRIBUTION;

EXPONENTIAL DISTRIBUTIONS; GAMMA DISTRIBUTIONS; KULLBACK-LEIBLER INFORMATION; TEST-OF-FIT FOR EXPONENTIALLY OF THE RESIDUAL LIFE (TF-ERL);

RELIABILITY THEORY;

EID: 0032084086     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.722289     Document Type: Article

References (8)

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