Modelling and simulation of hot-carriers degradation of high voltage floating lateral NDMOS transistors

Microelectronics Reliability

Volumn 38, Issue 6-8, 1998, Pages 1097-1101

  Vandenbossche, Eric ^a   De Keukeleire, Catherine ^a   De Wolf, Marc ^b   Van Hove, Hugo ^a   Witters, Johan ^a  

^a LUCENT TECHNOLOGIES   (United States)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; HOT CARRIERS; SEMICONDUCTOR DEVICE MODELS;

HIGH VOLTAGE FLOATING LATERAL TRANSISTORS;

MOSFET DEVICES;

EID: 0032084024     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00115-2     Document Type: Article

References (3)

1. R. Versari et al., "Hot Carrier Reliability in Submicron LDMOS transistors", EDM'97 Washington D.C. and related references.
2. MPACT4.8 Manual 1997.
3. SILVACO package manual 1997.