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Volumn 38, Issue 6-8, 1998, Pages 1143-1148

Design of a low EMI susceptibility CMOS transimpedance operational amplifier

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC IMPEDANCE; ELECTRIC NETWORK SYNTHESIS; ELECTROMAGNETIC WAVE INTERFERENCE;

EID: 0032083826     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00109-7     Document Type: Article
Times cited : (19)

References (10)
  • 3
    • 0022066773 scopus 로고
    • Predicting URF upset in MOSFET digital IC's
    • J. G. Tront, "Predicting URF upset in MOSFET digital IC's", IEEE Trans. Electromagnetic Compatibility, Vol. EMC-27, pp. 64-69, 1985.
    • (1985) IEEE Trans. Electromagnetic Compatibility , vol.EMC-27 , pp. 64-69
    • Tront, J.G.1
  • 7
    • 0042152478 scopus 로고
    • Failures induced on analog integrated circuits from conveyed electromagnetic interferences
    • Invited paper, Bordeaux, 4-7 Oct.
    • G. Masetti, S. Graffi, D. Golzio, Zs. M. V.-Kovàcs, "Failures induced on analog integrated circuits from conveyed electromagnetic interferences", Invited paper, Proc. of 1993 ESREF Conference, pp. 363-370, Bordeaux, 4-7 Oct. 1993.
    • (1993) Proc. of 1993 ESREF Conference , pp. 363-370
    • Masetti, G.1    Graffi, S.2    Golzio, D.3    Kovàcs, Zs.M.V.4
  • 8
    • 0029276103 scopus 로고
    • Design of Integrated BiC-MOS Operational Amplifiers with Low-Probability EMI-Induced Failures
    • P. Mattei, S. Graffi, Zs. M. V.-Kovàcs, G. Masetti, "Design of Integrated BiC-MOS Operational Amplifiers with Low-Probability EMI-Induced Failures", Microelectronics and Reliability, Vol. 35, pp. 567-586, 1994.
    • (1994) Microelectronics and Reliability , vol.35 , pp. 567-586
    • Mattei, P.1    Graffi, S.2    Kovàcs, Zs.M.V.3    Masetti, G.4
  • 9
    • 0025416106 scopus 로고
    • Operational Floating Amplifiers
    • J. Huijsing, "Operational Floating Amplifiers", Proc. IEE, vol. 137, n. 2, part G, pp. 131-136, 1990.
    • (1990) Proc. IEE , vol.137 , Issue.2 PART G , pp. 131-136
    • Huijsing, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.