The determination of rigid lattice shifts across delta-doped layers using regressional analysis

Ultramicroscopy

Volumn 72, Issue 3-4, 1998, Pages 199-211

  Dunin Borkowski, R E ^a,b   Stobbs, W Michael ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Delta doping; HREM; Regressional analysis; Rigid lattice contraction

Indexed keywords

ELECTRON MICROSCOPES; REGRESSION ANALYSIS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING;

DELTA-DOPING; RIGID LATTICE CONTRACTION;

ELECTRON MICROSCOPY;

ARTICLE; ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; MATHEMATICAL ANALYSIS; STATISTICAL ANALYSIS; THEORY;

EID: 0032078905     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00003-5     Document Type: Article

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