Study on microstructural characterization and ferromagnetic resonance in sputtered Co/V multilayers

Physica Status Solidi (A) Applied Research

Volumn 167, Issue 1, 1998, Pages 183-193

  Du, J ^a   Wu, J ^a   Tong, L N ^a   Lu, M ^a   Du, J H ^a   Pan, M H ^a   Zhai, H R ^a   Xia, H ^b  

^a NANJING UNIVERSITY   (China)

^b GENERAL RESEARCH INSTITUTE FOR NONFERROUS METALS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; CRYSTAL GROWTH; CRYSTAL STRUCTURE; FERROMAGNETIC RESONANCE; MAGNETIC PROPERTIES; POLYCRYSTALLINE MATERIALS; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM; X RAY DIFFRACTION;

RADIO FREQUENCY SPUTTERING;

METALLIC SUPERLATTICES;

EID: 0032075695     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199805)167:1<183::AID-PSSA183>3.0.CO;2-O     Document Type: Article

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