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Volumn 108, Issue 1-4, 1998, Pages 85-90

Structure and expected piezoelectric properties of sol-gel derived multilayer PZT films

Author keywords

Multilayer; Piezoelectricity; Porosity; PZT; Refractive index; Sol gel; TEM

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; HEAT TREATMENT; METALLIC FILMS; MULTILAYERS; PIEZOELECTRICITY; POROSITY; REFRACTIVE INDEX; SOL-GELS; TRANSMISSION ELECTRON MICROSCOPY; VOLUME FRACTION; X RAY DIFFRACTION ANALYSIS;

EID: 0032074932     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0167-2738(98)00023-x     Document Type: Article
Times cited : (8)

References (10)
  • 8
    • 0347475370 scopus 로고
    • Electro-Ceramics, Ohmsha Ltd., Tokyo, (in Japanese)
    • S. Naka, S. Hayakawa (Eds.), Electro-Ceramics, Fine Ceramics Technology Series, Vol. 3, Ohmsha Ltd., Tokyo, 1986, p. 48 (in Japanese).
    • (1986) Fine Ceramics Technology Series , vol.3 , pp. 48
    • Naka, S.1    Hayakawa, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.